Highest Accuracy in a single sweep: no averaging over multiple sweeps required
High measurement speed
Complete measurement across C/L-band in less than 10 seconds
Agilent/N7788BD/臺式光學元件分析儀
Highest Accuracy in a single sweep: no averaging over multiple sweeps required ,High measurement speed ,Complete measurement across C/L-band in less than 10 seconds （no need to wait for many averages） ,Robustness against fiber movement / vibration and drift.
Agilent Technologies pushes the limits of component measurements with the N7788BD Component Analyzer. Its proprietary technology is comparable with the well-known Jones-Matrix-Eigenanalysis （JME） which is the standard method for measuring Polarization Mode Dispersion （PMD） or differential group delay （DGD） of optical devices.
Agilent’s new single scan technology offers a range of advantages to test a complete set of parameters:DGD/ PMD ,PDL ,Power / Loss ,TE / TM-Loss ,2nd-order PMD ,Principal States of Polarization （PSPs） ,Jones and Mueller Matrices.
Designed for the Manufacturing Floor
High throughput: A complete analysis across the C and the L band is performed in less than 10 seconds!
Software Drivers: A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems.
Remote control: Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting.
Report Generation: Generating PDF reports is supported. The content including layout is configurable by the user.
Real time power readout: High throughput measurement of non-connectorized components is supported by providing a real time power readout which enables fiber coupling of the new device.現貨供應，咨詢！
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